| 序号 | 专利名 | 申请号 | 申请日 | 公开（公告）号 | 公开（公告）日 | 发明人 |
|---|---|---|---|---|---|---|
| 1 | 一种基于S波片测量径向偏振光纯度的装置及方法 | CN201910305484.3 | 2019-04-16 | CN110207825B | 2021-07-13 | 陈檬; 彭红攀; 周巍 |
| 本发明公开了一种基于S波片测量径向偏振光纯度的装置及方法，包括：沿光线传播方向依次放置的激光源、偏振转换装置、S波片和偏振光检测装置；激光源的水平出射光经偏振转换装置转换为径向偏振光，径向偏振光经S波片转换为线偏振光；偏振光检测装置检测线偏振光的纯度，基于线偏振光的纯度得到径向偏振光的纯度。本发明通过S波片将径向偏振光转换为线偏振光，用偏振检测装置检测线偏振光的纯度，从而得到径向偏振光偏振纯度；本发明具有简单、有效、高速的特点，能够快速检测径向偏振光的纯度。 | ||||||
| 2 | S偏振光透反膜、挡风窗、显示装置和交通设备 | CN202211175744.8 | 2022-09-26 | CN117805956A | 2024-04-02 | 吴慧军; 徐俊峰 |
| 本公开提供了一种S偏振光透反膜、挡风窗、显示装置和交通设备。S偏振光透反膜包括：交替设置的至少一层第一层和至少一层第二层，第一层的折射率大于第二层的折射率，第一层的层数小于或等于第二层的层数；S偏振光透反膜设置为相对于法线以第一角度范围反射S偏振光，且相对于法线以第二角度范围透射环境光，S偏振光透反膜对第一S偏振光的反射率大于或等于第一预设值，且对除第一S偏振光以外的处于可见光波段的光线的反射率比对第一S偏振光的反射率低至少5％，其中，第一S偏振光包括至少一个半峰宽小于或等于60nm的谱线或谱带。 | ||||||
| 3 | 一种基于S波片测量径向偏振光纯度的装置及方法 | CN201910305484.3 | 2019-04-16 | CN110207825A | 2019-09-06 | 陈檬; 彭红攀; 周巍 |
| 本发明公开了一种基于S波片测量径向偏振光纯度的装置及方法，包括：沿光线传播方向依次放置的激光源、偏振转换装置、S波片和偏振光检测装置；激光源的水平出射光经偏振转换装置转换为径向偏振光，径向偏振光经S波片转换为线偏振光；偏振光检测装置检测线偏振光的纯度，基于线偏振光的纯度得到径向偏振光的纯度。本发明通过S波片将径向偏振光转换为线偏振光，用偏振检测装置检测线偏振光的纯度，从而得到径向偏振光偏振纯度；本发明具有简单、有效、高速的特点，能够快速检测径向偏振光的纯度。 | ||||||
| 4 | 一种同时测量高反镜S和P偏振光反射率的方法 | CN201310413019.4 | 2013-09-11 | CN103471815B | 2016-07-06 | 李斌成; 祖鸿宇; 韩艳玲 |
| 本发明涉及一种同时测量高反镜对S和P偏振光反射率的方法，将光强周期性调制的连续激光注入稳定初始谐振腔，由探测器探测衰荡信号，通过双指数拟合得到初始谐振腔内S和P偏振光的衰荡时间τ0S和τ0P，计算得到腔镜S和P偏振光的平均反射率R0S和R0P；同样，在初始光学谐振腔两腔镜间根据使用角度放入待测高反镜构成测试光学谐振腔，得到测试腔S和P偏振光的衰荡时间τ1S和τ1P，计算出待测高反镜对S和P偏振光的反射率RXS和RXP。本发明优点：避免了以往测量高反镜反射率未区分S和P偏振态所引起的误差，可以应用任意偏振特性的激光器测量待测高反镜对S和P偏振光的反射率，可以不用起偏器，测量装置简单，测量精度高。 | ||||||
| 5 | 一种同时测量高反镜S和P偏振光反射率的方法 | CN201310413019.4 | 2013-09-11 | CN103471815A | 2013-12-25 | 李斌成; 祖鸿宇; 韩艳玲 |
| 本发明涉及一种同时测量高反镜对S和P偏振光反射率的方法，将光强周期性调制的连续激光注入稳定初始谐振腔，由探测器探测衰荡信号，通过双指数拟合得到初始谐振腔内S和P偏振光的衰荡时间τ0S和τ0P，计算得到腔镜S和P偏振光的平均反射率R0S和R0P；同样，在初始光学谐振腔两腔镜间根据使用角度放入待测高反镜构成测试光学谐振腔，得到测试腔S和P偏振光的衰荡时间τ1S和τ1P，计算出待测高反镜对S和P偏振光的反射率RXS和RXP。本发明优点：避免了以往测量高反镜反射率未区分S和P偏振态所引起的误差，可以应用任意偏振特性的激光器测量待测高反镜对S和P偏振光的反射率，可以不用起偏器，测量装置简单，测量精度高。 | ||||||
| 6 | S偏振光减反膜、前挡玻璃及平视显示系统 | CN202322797013.3 | 2023-10-18 | CN220872695U | 2024-04-30 | 吕敬波; 顾豪栋; 于佩强; 王雪利 |
| 本申请公开了一种S偏振光减反膜、前挡玻璃及平视显示系统，S偏振光减反膜包括基材层；减反层，布置在基材层一面，包括第一高折射率层、第一低折射率层、中折射率层、第二高折射率层和第二低折射率层；胶粘层布置在基材层另一面；S偏振光增反膜在400～700nm的整个光谱范围内对60～70°入射角的S偏振光具有至多5％的平均反射率。本申请的S偏振光减反膜能够显著降低由第二低折射率层一面入射的S偏振光的反射率；在应用至前挡玻璃的内表面上时，能够有效减少前挡玻璃内表面对S偏振光的反射率，解决重影问题。 | ||||||
| 7 | S偏振光透反膜、挡风窗、显示装置和交通设备 | CN202222552785.6 | 2022-09-26 | CN218455808U | 2023-02-07 | 吴慧军; 徐俊峰 |
| 本公开提供了一种S偏振光透反膜、挡风窗、显示装置和交通设备。S偏振光透反膜包括：交替设置的至少一层第一层和至少一层第二层，第一层的折射率大于第二层的折射率，第一层的层数小于或等于第二层的层数；S偏振光透反膜设置为相对于法线以第一角度范围反射S偏振光，且相对于法线以第二角度范围透射环境光，S偏振光透反膜对第一S偏振光的反射率大于或等于第一预设值，且对除第一S偏振光以外的处于可见光波段的光线的反射率比对第一S偏振光的反射率低至少5％，其中，第一S偏振光包括至少一个半峰宽小于或等于60nm的谱线或谱带。(ESM)同样的发明创造已同日申请发明专利 | ||||||
| 8 | 兼具偏振光轉換功能之高效率光源集光模組 A HIGH EFFICIENT LIGHT COLLECTING MODULE WITH P-S COVERSION | TW092109846 | 2003-04-24 | TW200422648A | 2004-11-01 | 王正 WANG, CHENG |
| 本發明係提供一兼具偏振光轉換功能之高效率光源集光模組。本模組包括一橢球燈、一反射罩、一反射型的偏振片、一半波長板。橢球燈之第二焦點與反射罩的焦點共點；而反射型的偏振片其偏極光反射面位於反射罩之焦點上，所以可將橢球燈所投射出來的光束之偏極性分開，即相同極性之光線在同一光束內。由於半波長板置於某一極性光束之前，而將此光束之極性轉換；且由於此架構可有效的減少反射罩的面積，使經由反射罩射出的光束，其面積、立體角均較一般常使用之聚光型燈源的面積、立體角為小；由此本架構即可達到兼具偏振光轉換功能之高效率光源集光模組。 | ||||||
| 9 | Image display device using P-polarized light and S-polarized light | US10575186 | 2004-10-07 | US07738179B2 | 2010-06-15 | Kenji Nishi |
| An image display device projects lights emitted from each of two two-dimensionally light emitting type photoelectric devices onto first and second light diffusing bodies, and projects and images transmitted images of the light diffusing bodies onto the retina in the respective eyeballs of the user. The display device includes one light source, a first polarization beam splitter dividing light emitted from the light source into P-polarized light and S-polarized light, and an optical system which leads each of the P-polarized light and S-polarized lights respectively to the two photoelectric devices thereby illuminating the two photoelectric devices. The optical system leads polarized light to each of the two photoelectric devices via a second polarization beam splitter and a λ/4 plate, and leads reflected lights to the relay optical system via the λ/4 plate and the second polarization beam splitter. | ||||||
| 10 | Projection display device and optical system modulating separated P-polarized light and S-polarazed light | US12289943 | 2008-11-07 | US08251516B2 | 2012-08-28 | Makoto Yoshimura |
| An optical system attaining a nearly double resolving power in spite of one projector and also eliminating a convergence device is provided. The system includes an 1:1 relay lens in place of a projector lens of a RGB split-combine projection system, and a quarter-wave plate for P-S polarization separation. In operation, once-modulated RGB composite light is divided into a P-polarized light and a S-polarized light by a PS separation wire grid. The S-polarized light is modulated by a luminance signal Y1 at a Y1 device. The P-polarized light is modulated by a luminance signal Y2 at a Y2 device. The lights modulated by the Y1/Y2 devices are combined with each other at a PS composite wire grid to project a synthetic light on a screen. | ||||||
| 11 | Bill or security discriminating apparatus using P-polarized and S-polarized light | US874761 | 1997-06-13 | US5892239A | 1999-04-06 | Mitsuhiro Nagase |
| A bill or security discriminating apparatus includes at least one irradiating device for irradiating a surface of a bill or security at a predetermined angle with the surface thereof, at least one polarization separating device for receiving light reflected by the surface of the bill or security and separating the received light into P-polarized light and S-polarized light, at least one first light detector for photoelectrically detecting the P-polarized light separated by the at least one polarization separating device and generating an electrical signal in accordance with intensity of the detected light, at least one second light detector for photoelectrically detecting the S-polarized light separated by the at least one polarization separating device and generating an electrical signal in accordance with intensity of the detected light, and a discriminator for discriminating the bill or security in accordance with the intensity of the P-polarized light and S-polarized light based on the electrical signals input from the at least one first light detector and the at least one second light detector. According to the thus constituted bill or security discriminating apparatus, it is possible to discriminate bills or securities with high accuracy even if they are damaged or wrinkled. | ||||||
| 12 | Surface inspection using the ratio of intensities of s- and p-polarized light components of a laser beam reflected a rough surface | US09820052 | 2001-03-28 | US20010010363A1 | 2001-08-02 | Masao Watanabe; Akiko Okubo |
| A surface inspection device irradiates a laser beam onto the surface of a sample, scans the surface two-dimensionally, and detects the intensities of the s-polarized light component and p-polarized light component of the reflected laser beam. RR (reflectance ratio), which is the ratio of the reflective intensities of the s- and p-polarized light components, is calculated for each position of the surface of the sample, and the two-dimensional distribution of RR on the surface of the sample is detected. The distribution width of this measured RR is compared with the natural width for a clean sample, and the surface of the sample is determined to be contaminated when, as the result of comparison, the RR distribution width diverges from the natural width. The absence or presence of contamination on the microscopically rough surface of a sample can therefore be quickly and easily determined based on the RR of the reflective intensities of the s- and p-polarized light components. | ||||||
| 13 | Surface inspection using the ratio of intensities of s- and p-polarized light components of a laser beam reflected a rough surface | US81924501 | 2001-03-28 | US6433877B2 | 2002-08-13 | WATANABE MASAO; OKUBO AKIKO |
| A surface inspection device irradiates a laser beam onto the surface of a sample, scans the surface two-dimensionally, and detects the intensities of the s-polarized light component and p-polarized light component of the reflected laser beam. RR (reflectance ratio), which is the ratio of the reflective intensities of the s- and p-polarized light components, is calculated for each position of the surface of the sample, and the two-dimensional distribution of RR on the surface of the sample is detected. The distribution width of this measured RR is compared with the natural width for a clean sample, and the surface of the sample is determined to be contaminated when, as the result of comparison, the RR distribution width diverges from the natural width. The absence or presence of contamination on the microscopically rough surface of a sample can therefore be quickly and easily determined based on the RR of the reflective intensities of the s- and p-polarized light components. | ||||||
| 14 | Surface inspection using the ratio of intensities of s—and p-polarized light components of a laser beam reflected a rough surface | US09820052 | 2001-03-28 | US06376852B2 | 2002-04-23 | Masao Watanabe; Akiko Okubo |
| A surface inspection device irradiates a laser beam onto the surface of a sample, scans the surface two-dimensionally, and detects the intensities of the s-polarized light component and p-polarized light component of the reflected laser beam. RR (reflectance ratio), which is the ratio of the reflective intensities of the s- and p-polarized light components, is calculated for each position of the surface of the sample, and the two-dimensional distribution of RR on the surface of the sample is detected. The distribution width of this measured RR is compared with the natural width for a clean sample, and the. surface of the sample is determined to be contaminated when, as the result of comparison, the RR distribution width diverges from the natural width. The absence or presence of contamination on the microscopically rough surface of a sample can therefore be quickly and easily determined based on the RR of the reflective intensities of the s- and p-polarized light components. | ||||||
| 15 | Substrate internal defect and external particle detecting apparatus using s-polarized and p-polarized light | US216190 | 1994-03-22 | US5424536A | 1995-06-13 | Kazuo Moriya |
| A defect estimating apparatus includes a laser radiating unit For obliquely radiating laser light on a surface to be observed of an object to be inspected, an observing unit for observing, through the surface to be observed, scattered light produced From internal defects or particles of the object by refracted light of the laser light, and observing scattered light or reflected light produced from flaws or particles on the surface by tile laser light, and a component separating unit for allowing the observing unit to perform observation by using both light containing primarily a p-polarized light component of the laser light and light containing primarily an s-polarized light component of the laser light. | ||||||
| 16 | 投影机 | CN201210245625.5 | 2012-07-16 | CN103543529B | 2016-05-18 | 黄茹苹; 林昀毅 |
| 本发明涉及一种投影机，包括偏振光转换器以及反射式偏光片。非偏振光包括第一S偏振光以及第一P偏振光。偏振光转换器用于接收非偏振光，使其中第一S偏振光通过，而其中大部份第一P偏振光通过后则转变成第二S偏振光，少部份第一P偏振光则直接通过偏振光转换器。反射式偏光片用于让第一S偏振光以及第二S偏振光通过，并将少部份直接通过偏振光转换器的第一P偏振光反射回到偏振光转换器。 | ||||||
| 17 | 投影机 | CN201210245625.5 | 2012-07-16 | CN103543529A | 2014-01-29 | 黄茹苹; 林昀毅 |
| 本发明涉及一种投影机，包括偏振光转换器以及反射式偏光片。非偏振光包括第一S偏振光以及第一P偏振光。偏振光转换器用于接收非偏振光，使其中第一S偏振光通过，而其中大部份第一P偏振光通过后则转变成第二S偏振光，少部份第一P偏振光则直接通过偏振光转换器。反射式偏光片用于让第一S偏振光以及第二S偏振光通过，并将少部份直接通过偏振光转换器的第一P偏振光反射回到偏振光转换器。 | ||||||
| 18 | 光谱分析装置、光谱分析方法、钢带的制造方法及钢带的质量保证方法 | CN201880086625.0 | 2018-12-17 | CN111630367B | 2023-03-14 | 西泽佑司; 辻翔太; 加藤香穗 |
| 受光部(3)具备：偏振光分离部(32)，将反射光分离成S偏振光和P偏振光；S偏振光检测部(34)，检测由偏振光分离部(32)分离出的S偏振光，将表示检测到的S偏振光的强度的电信号向输出部(4)输出；及P偏振光检测部(33)，检测由偏振光分离部(32)分离出的P偏振光，将表示检测到的P偏振光的强度的电信号向输出部(4)输出。输出部(4)使用从S偏振光检测部(34)及P偏振光检测部(33)输出的电信号，根据S偏振光与P偏振光的强度比来算出吸光度，使用任意的波数下的吸光度的强度来算出测定对象物P的表面的组成及/或组成比。 | ||||||
| 19 | 光谱分析装置、光谱分析方法、钢带的制造方法及钢带的质量保证方法 | CN201880086625.0 | 2018-12-17 | CN111630367A | 2020-09-04 | 西泽佑司; 辻翔太; 加藤香穗 |
| 受光部(3)具备：偏振光分离部(32)，将反射光分离成S偏振光和P偏振光；S偏振光检测部(34)，检测由偏振光分离部(32)分离出的S偏振光，将表示检测到的S偏振光的强度的电信号向输出部(4)输出；及P偏振光检测部(33)，检测由偏振光分离部(32)分离出的P偏振光，将表示检测到的P偏振光的强度的电信号向输出部(4)输出。输出部(4)使用从S偏振光检测部(34)及P偏振光检测部(33)输出的电信号，根据S偏振光与P偏振光的强度比来算出吸光度，使用任意的波数下的吸光度的强度来算出测定对象物P的表面的组成及/或组成比。 | ||||||
| 20 | 光束分离模组、激光雷达系统及其控制方法 | CN201910269210.3 | 2019-04-04 | CN110007314A | 2019-07-12 | 罗斯特; 王吉; 刘夏; 魏威; 李兴华 |
| 本申请涉及一种光束分离模组、激光雷达系统及其控制方法。包括：第一分光组件、旋光组件以及第二分光组件；第一分光组件用于将入射光束分离为第一P偏振光和第一S偏振光；旋光组件用于将第一P偏振光旋转为第二S偏振光以及将第一S偏振光旋转为第二P偏振光；第二分光组件用于将第二P偏振光和第二S偏振光混合成射向目标对象的第一出射光束；第二分光组件还用于将回波光束分离为第三P偏振光和第三S偏振光；旋光组件还用于维持第三P偏振光和第三S偏振光的偏振方向；第一分光组件还用于将第三P偏振光和第三S偏振光混合为射向激光探测模组的第二出射光束。本发明实施例使激光探测模组能接收到P偏振光，增大了激光探测模组接收到的能量。 | ||||||
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