Loop shaped circuit test point |
|||||||
| 申请号 | US47648274 | 申请日 | 1974-06-05 | 公开(公告)号 | US3885854A | 公开(公告)日 | 1975-05-27 |
| 申请人 | GTE AUTOMATIC ELECTRIC LAB INC; | 发明人 | REIMER WILLIAM A; | ||||
| 摘要 | A loop-shaped circuit test point formed from resilient wire held in a rigid mounting block through the combination of torsion and compression. When the top of the loop is cut, the two ends will spring apart isolating the circuit connection. When reconnection of the loop is desired the two top sections are passed by each other and crossed over and released thus allowing two section of the loop to hold each other together. | ||||||
| 权利要求 | 1. A loop-shaped circuit test point constructed of electrically conductive wire comprising: a head shaped portion forming the top of said test point; a body portion consisting of two legs, the uppermost portion of said body converging to form a shoulder portion; a neck portion coupling said shoulder portion to said head portion, each of said legs following a diverging path from said shoulder portion, the lower portion of each of said legs passing through a rigid base on a slightly converging path and passing through and beyond said base essentially parallel to each other, to form circuit connecting terminals. 2. A loop-shaped circuit test point as claimed in claim 1 wherein: said electrically conductive wire is prestressed by mounting in said rigid base. 3. A loop-shaped circuit test point as claimed in claim 1 wherein: said electrically conductive wire is of resilient material. 4. A loop-shaped circuit test point as claimed in claim 1 wherein: said rigid base is constructed of a electrically non-conductive material. 5. A loop-shaped circuit test point as claimed in claim 1 wherein: said electrically conductive wire is twisted axially before insertion into said base. 6. A loop-shaped circuit test point as claimed in claim 1 wherein: said base further includes at least one additional loop shaped circuit test point passing therethrough. 7. A loop-shaped circuit test point as claimed in claim 6 wherein: said base contains at least one electrically non-conductive barrier located between said test points. |
||||||
| 说明书全文 | |||||||
QQ群二维码
意见反馈
意见反馈