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Test signal generating circuit

阅读:766发布:2023-02-13

专利汇可以提供Test signal generating circuit专利检索,专利查询,专利分析的服务。并且PURPOSE:To make the scale of a hard ware small and to enable generating of a test signal having a high-degree of freedom, by a method wherein a large number of frequencies is generated from a memory storing sine wave signal for one period, and an output of each frequency is composed. CONSTITUTION:If all points are repeatedly read at intervals of t0 from a memory 6 storing a sine wave form, a frequency is brought to f=1/Nt0, and if they are read by thinning one point, it is brought to f1=2/Nt0. Thus, a signal of frequency counted by integral number times is outputted by changing the number of thinning points. The thinning value is outputted by changing the number of thinning points. The thinning value is written in a memory 2, and a preceding read address and a thinning value are added to an adder 3 to produce a new address to store it in a memory 4. A latch circuit 5 inputs data written in the memory 4 to produce the address of the memory 6. An output of a generating frequency is added by an adder 9 and a latch circuit 10 M times, and this composes an amplitude of M types of frequencies and causes it to be inputted to a latch circuit 11.,下面是Test signal generating circuit专利的具体信息内容。

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