Semiconductor light detector
专利汇可以提供Semiconductor light detector专利检索，专利查询，专利分析的服务。并且PURPOSE: To increase a light detecting output and raise a responsive speed more higher by improving the characteristic of a semiconductor layer in each semiconductor region.
CONSTITUTION: An n-type semiconductor layer 2 is formed on an n-type semiconductor layer 1, p-type semiconductor regions 3 and 4 in the layer 2 keeping a predetermined distance from the layer 1 and n-type semiconductor regions 5 and 6 are formed in the layers 3 and 4 in the opposite side of the layer 1, and terminals 7 and 8 are provided in the layer 1 and region 6. A PIN photodiode H having the layer 1 for the N layer, the layer 2 for the I layer and the region 3 for the P layer is formed to form NPN transistors T
1 and T
2 by the layers 1 and 2, the regions 4 and 6 and the regions 3 and 5, and the region 5 is connected by a wiring 9 to the region 4. A specific resistance on the layer 2 is selectively set greater than the layer 1 and region 3, a thickness D of a region 3F is selectively set greater than the characteristic collecting wavelength of the layer 2 to the light L incident to the layer 2, the impurity for compensating a carrier density is introduced to the layer 2, and the increasing of the detecting output and the responsive speed can be materialized.
COPYRIGHT: (C)1980,JPO&Japio，下面是Semiconductor light detector专利的具体信息内容。
| 标题 | 发布/更新时间 | 阅读量 |
|---|---|---|
| 显示面板、显示设备、指纹解锁方法及触控方法 | 2020-05-08 | 928 |
| 光刻机照度均匀度的检测方法 | 2020-05-11 | 723 |
| 一种基于温度调谐的全光纤偏振稳定装置及稳定方法 | 2020-05-13 | 988 |
| 激光测距装置和机器人 | 2020-05-08 | 175 |
| 一种显示基板及其制作方法、显示装置 | 2020-05-13 | 722 |
| 一种集成封装的光引擎及其信号发射、接收方法 | 2020-05-14 | 500 |
| 一种基于BOX封装的超高频射频光电探测器 | 2020-05-11 | 731 |
| 一种作物氮素检测装置及其检测方法 | 2020-05-14 | 394 |
| 辐射探测宽带模拟光纤传输系统 | 2020-05-08 | 108 |
| 利用PSD器件对固体线膨胀系数的测量实验装置 | 2020-05-13 | 991 |
高效检索全球专利专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台，是提供专利分析，专利查询，专利检索等数据服务功能的知识产权数据服务商。
我们的产品包含105个国家的1.26亿组数据，免费查、免费专利分析。
专利汇分析报告产品可以对行业情报数据进行梳理分析，涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度，系统通过AI智能系统对图表进行解读，只需1分钟，一键生成行业专利分析报告。
