首页 / 专利库 / 物理 / 离子阱 / Method to introduce ion to ion trap of ion cyclotron resonance spectrometer, and ion cyclotron resonance spectrometer to perform this method

Method to introduce ion to ion trap of ion cyclotron resonance spectrometer, and ion cyclotron resonance spectrometer to perform this method

阅读:41发布:2021-11-26

专利汇可以提供Method to introduce ion to ion trap of ion cyclotron resonance spectrometer, and ion cyclotron resonance spectrometer to perform this method专利检索,专利查询,专利分析的服务。并且PURPOSE: To easily decelerate an ion, and increase the concentration degree of a captured ion by imparting a motional component extending in the direction perpendicular to a magnetic field to an ion entering an ion trap.
CONSTITUTION: A hole 5 arranged in one wall 4 of an ion trap 10 is dislocated sideways to the symmetry axis 16 of the trap extending in parallel to a magnetic field. Therefore, a beam enters an area where an electrostatic field in the trap 10 has a crossing component to the axis 16 by electric potential impressed on the wall 4. As a result, when an ion enters the trap 10, the ion is refracted by a magnetic field B and the electrostatic field in the trap, and slips out of its rectilinear orbit. An impulse component in the ion axis 16 direction is decelerated to speed or less necessary for the ion to instantly escape from the inside of a cell. In this way, since the dwell time of the ion entering the trap increases, the ion is accumulated in this staying time, and very high ion density can be obtained.
COPYRIGHT: (C)1989,JPO,下面是Method to introduce ion to ion trap of ion cyclotron resonance spectrometer, and ion cyclotron resonance spectrometer to perform this method专利的具体信息内容。

高效检索全球专利

专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台,是提供专利分析,专利查询,专利检索等数据服务功能的知识产权数据服务商。

我们的产品包含105个国家的1.26亿组数据,免费查、免费专利分析。

申请试用

分析报告

专利汇分析报告产品可以对行业情报数据进行梳理分析,涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度,系统通过AI智能系统对图表进行解读,只需1分钟,一键生成行业专利分析报告。

申请试用

QQ群二维码
意见反馈