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High resistance measuring device

阅读:600发布:2021-11-25

专利汇可以提供High resistance measuring device专利检索,专利查询,专利分析的服务。并且PURPOSE:To reduce an error in measurement and to shorten measurement time, by applying a test voltage to a sample to be measured and a reference resistance through a filter, and further connecting a terminating resistance and a shorting circuit to the other terminal of the sample and supplying it to a two- input logarithmetic amplifier. CONSTITUTION:The test voltage from a terminal 41 has a ripple removed through a capacitor 42 of about 1,000muF and a choke coil 43 of about 5H and is supplied to the sample 11 to be measured and applied to the two-input logarithmic converting amplifier 47 through the reference resistance 46. To the other input of the amplifier 47, the other terminal of the sample 11 is connected through the short-circuit protecting circuit consisting of a resistance 48 of 1KOMEGA, a resistance 49 of 100KOMEGA, and a Zener diode 50 and the terminating resistance 52 of 100KOMEGA. An A/D converter 53 is connected to the output of the amplifier 47 and its output 54 is processed by a microcomputer, etc., to reduce an error in measurement for a relatively high resistance value between 10 and 10 OMEGA and also to shorten measurement time.,下面是High resistance measuring device专利的具体信息内容。

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