首页 / 专利库 / 电子零件及设备 / 电子电路 / APPARATUS AND METHOD FOR ELECTRONIC CIRCUIT PROTECTION

APPARATUS AND METHOD FOR ELECTRONIC CIRCUIT PROTECTION

阅读:108发布:2024-02-12

专利汇可以提供APPARATUS AND METHOD FOR ELECTRONIC CIRCUIT PROTECTION专利检索,专利查询,专利分析的服务。并且Apparatus and methods for electronic circuit protection are disclosed. In one embodiment, an apparatus (1) comprises a substrate (247) that includes an n-well (251b) and a p-well (254b) adjacent the n-well. An n-type active area (243c) and a p-type active area (242c) are disposed in the n-well. The p-type active area, the n-well, and the p-well are configured to operate as an emitter, a base, and a collector of an PNP bipolar transistor (22), respectively, and the p-type active area surrounds at least a portion of the n-type active area so as to aid in recombining carriers injected into the n-well from the p-well before the carriers reach the n-type active area. The n-well and the p-well are configured to operate as a breakdown diode (27), and a punch-through breakdown voltage between the n-well and the p-well is lower than or equal to about a breakdown voltage between the p-type active area and the n-well.,下面是APPARATUS AND METHOD FOR ELECTRONIC CIRCUIT PROTECTION专利的具体信息内容。

高效检索全球专利

专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台,是提供专利分析,专利查询,专利检索等数据服务功能的知识产权数据服务商。

我们的产品包含105个国家的1.26亿组数据,免费查、免费专利分析。

申请试用

分析报告

专利汇分析报告产品可以对行业情报数据进行梳理分析,涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度,系统通过AI智能系统对图表进行解读,只需1分钟,一键生成行业专利分析报告。

申请试用

QQ群二维码
意见反馈