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Method and instrument for measuring shape of digged surface

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专利汇可以提供Method and instrument for measuring shape of digged surface专利检索,专利查询,专利分析的服务。并且PURPOSE:To measure the three-dimensional shape of an objective surface instantaneously without any person's intervention by obtaining the displacement between the plane position on a light point obtained on an image pickup surface by irradiating an uneven surface with numbers of spot light beams and that of a light spot formed on the image pickup surface by projecting light on a virtual surface at known distance. CONSTITUTION:A projecting machine 1 is installed in front of a section with unevenness such as a digged surface and numbers of spots are projected on the surface 5 to form light points 6 on the section 5; and an image of the light points is picked up by a video camera 2, etc., arranged at distance from the projection machine 1 and a computer calculates the displacement between the position of each light point on an image pickup surface 8 and the plane position of a light point obtained on the image pickup surface 8 by picking up an image of a light point formed when projected on a virtual plane 7 set at known distance stored in the computer by the projecting machine 1 and then calculates the deviation between the objective surface 5 and virtual plane 7 to measure the three-dimensional shape of the objective surface 5.,下面是Method and instrument for measuring shape of digged surface专利的具体信息内容。

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