首页 / 专利库 / 显示技术 / 边缘图像 / Method and device for picture inspection

Method and device for picture inspection

阅读:88发布:2022-04-05

专利汇可以提供Method and device for picture inspection专利检索,专利查询,专利分析的服务。并且PURPOSE: To mask an edge part for correction of a shift of position of a picture and to perform the inspection of pictures, by comparing the high-quality picture data with the edge picture data and utilizing one having larger value of both data to form the reference picture data.
CONSTITUTION: A camera 1 obtains the picture data out of an original and applies it to a memory M1 or M2 vua a switch circuit SW1 after digital conversion. The high-quality picture data supplied from the memory M1 undergoes the edge masking process and is applied to the memory M2. While the memory data of both memories are compared with each other by a comparator 4 for each picture element density. The data having larger value is stored in the memory M1. Then the difference between both data is detected by an arithmetic circuit 5 for each picture element density and stored in the memory M2. The output of the M2 is applied to a picture element number detecting circuit 6, and the number of picture elements is detected in response to a deciding level signal. The result of this detection is stored in a reference data memory circuit 28 or an inspection data memory circuit 9 via a switch circuit SW2. The storage contents of both circuits 8 and 9 are fed to a deciding circuit 10 for decision of picture quality.
COPYRIGHT: (C)1986,JPO&Japio,下面是Method and device for picture inspection专利的具体信息内容。

高效检索全球专利

专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台,是提供专利分析,专利查询,专利检索等数据服务功能的知识产权数据服务商。

我们的产品包含105个国家的1.26亿组数据,免费查、免费专利分析。

申请试用

分析报告

专利汇分析报告产品可以对行业情报数据进行梳理分析,涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度,系统通过AI智能系统对图表进行解读,只需1分钟,一键生成行业专利分析报告。

申请试用

QQ群二维码
意见反馈