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Transistor parameter extracting system based upon cooling relaxation method

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专利汇可以提供Transistor parameter extracting system based upon cooling relaxation method专利检索,专利查询,专利分析的服务。并且PURPOSE:To efficiently and surely extract a parameter having the smallest error in a calculation formula for calculating the characteristics of a transistor (TR) by using a computer to be exclusively used for a cooling easing method for extracting the parameter by the cooling easing method. CONSTITUTION:The titled system is provided with the computer 1 to be exclusively used for the cooling easing method, a display device 2 for displaying a result processed by the computer 1 or a measured result of a measuring instrument 3 and the measured instrument 3 for measuring the characteristics of a TR using a wafer 4 as a model. Namely, at the time of dropping a temperature at the probability proportional to a Boltzman factor in statistical mechanisms, the computer 1 is driven based upon the cooling easing method adopting a principle for arranging grains on the most stabled position. Consequently, the parameter with the smallest error in the calculation formula for calculating the characteristics of the TR can be efficiently and surely extracted.,下面是Transistor parameter extracting system based upon cooling relaxation method专利的具体信息内容。

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