PURITY MONITOR |
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| 申请号 | US15291712 | 申请日 | 2016-10-12 | 公开(公告)号 | US20180142937A1 | 公开(公告)日 | 2018-05-24 |
| 申请人 | Raytheon Company; | 发明人 | Paul L. Buelow; | ||||
| 摘要 | A purity monitor is provided. The purity monitor includes a cryo-cooler and a piezo-electric crystal microbalance that may have a matte finish. The cryo-cooler includes a nozzle and plumbing components disposed to supply a fluid having a working pressure of up to 10,000 psig to the nozzle. The nozzle provides for locating substantially all of a pressure drop of the cryo-cooler near an exit thereof. The nozzle sprays fluid onto the piezo-electric crystal microbalance and the piezo-electric crystal microbalance measures a mass of non-volatile residue (NVR) left thereon by the spraying. Respective temperatures of the fluid and the piezo-electric crystal microbalance are controllable based on a type of the NVR. | ||||||
| 权利要求 | |||||||
| 说明书全文 | |||||||
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