Scattering parameter meter
专利汇可以提供Scattering parameter meter专利检索，专利查询，专利分析的服务。并且PURPOSE: To make it possible to meter the scattering parameters under the condition having an active element operating at all times by supplying the signals from their source to the input and output terminals in a preset relationship between the phase and amplitude with the use of a power distributor.
CONSTITUTION: The signals from their source 5, which are distributed at a preset distribution ratio by a power distributor 9, are fed as incidence signals in a preset relationship between the phase and amplitude through circulators 11 and 13 and directional couplers 4 and 6 to the device 3 which is operative to meter the scattering parameters of a 2-port device having input and output terminals 1 and 2. At this time, the scattering from the terminals 1 and 2 or the amplitude and phase of the reflected and incidence signals are compared and are read out by a signal detector 8. Thus, the scattering parameters can be metered under the condition having the input signals at all times, especially, under the condition in which the active element is operated by the input signals.
COPYRIGHT: (C)1979,JPO&Japio，下面是Scattering parameter meter专利的具体信息内容。
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